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Conference Paper
International Quantum Electronics Conference
Baltimore, Maryland United States
May 31, 2009 - June 5, 2009
ISBN: 978-1-55752-869-8
Joint IQEC Poster Session III (JThE)

Infrared Stimulated Parametric Emission Microscopy

Xuejun Liu, Cristina Rodriguez, Wolfgang Rudolph, and James L. Thomas

http://dx.doi.org/10.1364/CLEO.2009.JThE61


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Abstract

A femtosecond four-wave mixing microscopy was applied to image electronically resonant species, and to measure nonlinear susceptibilities. The parametric emission signal from dye molecules is resistant to photobleaching, making this technique attractive for biological samples.

© 2009 The Optical Society

OCIS Codes
(180.0180) Microscopy : Microscopy
(190.0190) Nonlinear optics : Nonlinear optics
(190.4380) Nonlinear optics : Nonlinear optics, four-wave mixing
(180.4315) Microscopy : Nonlinear microscopy

Citation
X. Liu, C. Rodriguez, W. Rudolph, and J. L. Thomas, "Infrared Stimulated Parametric Emission Microscopy," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference, OSA Technical Digest (CD) (Optical Society of America, 2009), paper JThE61.
http://www.opticsinfobase.org/abstract.cfm?URI=IQEC-2009-JThE61


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