This paper presents a summary of the main results we observed on irradiated imagers manufactured using a0.18µm CMOS processes dedicated to imaging. Several types of energetic particles have been used to irradiate the devices.
© 2011 OSA
V. Goiffon and P. Magnan, "Radiation Damages in CMOS Active Pixel Sensors," in Imaging and Applied Optics, OSA Technical Digest (CD) (Optical Society of America, 2011), paper IMA3.
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