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Conference Paper
Imaging Systems and Applications
Toronto Canada
July 10-14, 2011
ISBN: 978-1-55752-914-5
Image Sensors (IMA)

Radiation Damages in CMOS Active Pixel Sensors

Vincent Goiffon and Pierre Magnan  »View Author Affiliations


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This paper presents a summary of the main results we observed on irradiated imagers manufactured using a0.18µm CMOS processes dedicated to imaging. Several types of energetic particles have been used to irradiate the devices.

© 2011 OSA

OCIS Codes
(040.1240) Detectors : Arrays
(040.6070) Detectors : Solid state detectors

V. Goiffon and P. Magnan, "Radiation Damages in CMOS Active Pixel Sensors," in Imaging and Applied Optics, OSA Technical Digest (CD) (Optical Society of America, 2011), paper IMA3.

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