Interferometric Localization Microscopy

Carl G. Ebeling; Amihai Meiri; Erik M. Jorgensen; Zeev Zalevsky; Jordan M. Gerton; Rajesh Menon

doi:10.1364/DH.2014.JTh1C.6

Imaging and Applied Optics 2014
OSA Technical Digest (online) (Optica Publishing Group, 2014),
paper JTh1C.6
•https://doi.org/10.1364/DH.2014.JTh1C.6

Interferometric Localization Microscopy

Carl G. Ebeling, Amihai Meiri, Erik M. Jorgensen, Zeev Zalevsky, Jordan M. Gerton, and Rajesh Menon

Imaging Systems and Applications 2014

Seattle, Washington United States
13–17 July 2014
ISBN: 978-1-55752-308-2

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Joint Session With DH (JTh1C)

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C. G. Ebeling, A. Meiri, E. M. Jorgensen, Z. Zalevsky, J. M. Gerton, and R. Menon, "Interferometric Localization Microscopy," in Imaging and Applied Optics 2014, OSA Technical Digest (online) (Optica Publishing Group, 2014), paper JTh1C.6.

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Abstract

Interference of signal in Fourier space, emitted from single probes, is used to localize it by recording and computing the phase of the fringes. Such system has applications in super resolution localization microscopy.

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