We have used x-ray absorption to systematically study the structural changes occurring during the amorphous to crystalline transition in several representative compounds lying on this tie-line including GeTe, Ge2Sb2Te5, and GeSb2Te4.
© 2005 Optical Society of America
(210.0210) Optical data storage : Optical data storage
(210.4810) Optical data storage : Optical storage-recording materials
(310.0310) Thin films : Thin films
(310.6870) Thin films : Thin films, other properties
P. J. Fons, A. V. Kolobov, J. Tominaga, and T. Uruga, " An XAFS Study of Amorphous Crystalline Phase Transitions along the GeTe-Sb2Te3 Pseudobinary Tie Line," in International Symposium on Optical Memory and Optical Data Storage, OSA Technical Digest Series (Optical Society of America, 2005), paper WC4.
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