OSA's Digital Library

Optics InfoBase > Conference Papers > ISOM_ODS > 2005 > WC > Page WC4 © 2005 OSA

Conference Paper
International Symposium on Optical Memory and Optical Data Storage
Honolulu, Hawaii United States
July 10, 2005
ISBN: 1-55752-794-6
Testing and Modeling (WC)

An XAFS Study of Amorphous Crystalline Phase Transitions along the GeTe-Sb2Te3 Pseudobinary Tie Line

Paul J. Fons, Alexander V. Kolobov, Junji Tominaga, and Tomoya Uruga

http://dx.doi.org/10.1364/ISOM_ODS.2005.WC4


View Full Text Article

Acrobat PDF (769 KB) Note that full-text PDFs from conferences typically contain 1-3 pages of content, some or all of which might be an abstract, summary, or miscellaneous items.





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations
  • Export Citation/Save Click for help

Abstract

We have used x-ray absorption to systematically study the structural changes occurring during the amorphous to crystalline transition in several representative compounds lying on this tie-line including GeTe, Ge2Sb2Te5, and GeSb2Te4.

© 2005 Optical Society of America

OCIS Codes
(210.0210) Optical data storage : Optical data storage
(210.4810) Optical data storage : Optical storage-recording materials
(310.0310) Thin films : Thin films
(310.6870) Thin films : Thin films, other properties

Citation
P. J. Fons, A. V. Kolobov, J. Tominaga, and T. Uruga, " An XAFS Study of Amorphous Crystalline Phase Transitions along the GeTe-Sb2Te3 Pseudobinary Tie Line," in International Symposium on Optical Memory and Optical Data Storage, OSA Technical Digest Series (Optical Society of America, 2005), paper WC4.
http://www.opticsinfobase.org/abstract.cfm?URI=ISOM_ODS-2005-WC4


Sort:  Journal  |  Reset

References

References are not available for this paper.

OSA is a member of CrossRef.

CrossCheck Deposited