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Conference Paper
International Symposium on Optical Memory and Optical Data Storage
Honolulu, Hawaii United States
July 10, 2005
ISBN: 1-55752-794-6
Poster Session III (WP)

Auto-Alignment for the Focusing Unit of NFR System by Pattern Recognition of Neural Network

Hyoung Kil Yoon, Jun-Hee Lee, Jae Hwa Jeong, See-Hyung Lee, and Dae-Gab Gweon

http://dx.doi.org/10.1364/ISOM_ODS.2005.WP23


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Abstract

In the viewpoint of the assembly, the auto-alignment methodology of the focusing unit of NFR system is proposed and verified experimentally. Mainly, the pattern recognition by the neural network was used to methodology.

© 2005 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(220.0220) Optical design and fabrication : Optical design and fabrication
(220.4880) Optical design and fabrication : Optomechanics

Citation
H. K. Yoon, J. Lee, J. H. Jeong, S. Lee, and D. Gweon, " Auto-Alignment for the Focusing Unit of NFR System by Pattern Recognition of Neural Network," in International Symposium on Optical Memory and Optical Data Storage, OSA Technical Digest Series (Optical Society of America, 2005), paper WP23.
http://www.opticsinfobase.org/abstract.cfm?URI=ISOM_ODS-2005-WP23


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