We present spectroscopic ellipsometry measurements of a metamaterial, taken under different incidence angles and compared with calculations based on the RCWA method. We find that resonances for (Psi,Delta) do not disappear changing the incidence angle.
© 2010 The Optical Society
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.0160) Materials : Materials
(160.3918) Materials : Metamaterials
M. L. Miranda-Medina, B. Dastmalchi, H. Schmidt, E. -. Kley, I. Bergmair, K. Hingerl, and J. j. Sanchez Mondragon, "Spectroscopic Ellipsometry Study of a Swiss Cross Metamaterial," in Latin America Optics and Photonics Conference, OSA Technical Digest (CD) (Optical Society of America, 2010), paper WE14.
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