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Conference Paper
Latin America Optics and Photonics Conference
Recife Brazil
September 27-30, 2010
ISBN: 978-1-55752-903-9
Joint Poster Session II (WE)

Spectroscopic Ellipsometry Study of a Swiss Cross Metamaterial

M. L. Miranda-Medina, B. Dastmalchi, H. Schmidt, E.-b. Kley, I. Bergmair, K. Hingerl, and J.j. Sanchez Mondragon

http://dx.doi.org/10.1364/LAOP.2010.WE14


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Abstract

We present spectroscopic ellipsometry measurements of a metamaterial, taken under different incidence angles and compared with calculations based on the RCWA method. We find that resonances for (Psi,Delta) do not disappear changing the incidence angle.

© 2010 The Optical Society

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.0160) Materials : Materials
(160.3918) Materials : Metamaterials

Citation
M. L. Miranda-Medina, B. Dastmalchi, H. Schmidt, E. -. Kley, I. Bergmair, K. Hingerl, and J. j. Sanchez Mondragon, "Spectroscopic Ellipsometry Study of a Swiss Cross Metamaterial," in Latin America Optics and Photonics Conference, OSA Technical Digest (CD) (Optical Society of America, 2010), paper WE14.
http://www.opticsinfobase.org/abstract.cfm?URI=LAOP-2010-WE14


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