Abstract
We extend a simple method to measure the ultrashort ablation threshold of solid samples, the D-Scan, to take into account the pulses superposition. Its simplicity allows many measurements to be quickly performed under various superposition conditions, providing the sample incubation parameter. Preliminary results obtained for dielectrics indicate that the ablation threshold and incubation parameter increase with the bandgap energy.
© 2012 Optical Society of America
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