(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(300.2140) Spectroscopy : Emission
C. Fabre, J. Dubessy, M. Boiron, R. Brennetot, P. Fichet, E. Vors, J. L. Lacour, and A. Rivoallan, "A LIBS spectral database obtained in Martian conditions with an echelle spectrometer for in situ analysis of Mars soils and rocks,"
in Laser Induced Plasma Spectroscopy and Applications, A. Sawchuk, ed.,
Vol. 81 of OSA Trends in Optics and Photonics Series
(Optical Society of America, 2002), paper ThE3.
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