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Conference Paper
Laser Science
Rochester, New York United States
October 10, 2006
ISBN: 1-55752-818-7
Welcome Reception and Joint FiO/LS Poster Session I (JSuA)

Characterization of Subwavelength-Scale Marginal Roughness from Far-Field Irradiance

Jyh-Long Chern and Shu-Chun Chu

http://dx.doi.org/10.1364/FIO.2006.JSuA38


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Abstract

A constructed-aperture approach is proposed to measure marginal roughness by far-field irradiance. It is numerically shown that spatial profile could be retrieved with an error less than 3%, even its variation is in subwavelength scale.

© 2006 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(050.1940) Diffraction and gratings : Diffraction
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(070.2580) Fourier optics and signal processing : Paraxial wave optics

Citation
J. Chern and S. Chu, "Characterization of Subwavelength-Scale Marginal Roughness from Far-Field Irradiance," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA38.
http://www.opticsinfobase.org/abstract.cfm?URI=LS-2006-JSuA38


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