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Conference Paper
Laser Science
Rochester, New York United States
October 10, 2006
ISBN: 1-55752-818-7
Joint FiO/LS Poster Session II (JWD)

Electrical Measurement of Quantum Interference Population Control in a Semiconductor

Jared K. Wahlstrand, Ryan P. Smith, Jessica A. Pipis, Peter A. Roos, and Steven T. Cundiff

http://dx.doi.org/10.1364/FIO.2006.JWD105


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Abstract

We present the results of an electrical measurement of carrier population control via quantum interference between one- and two-photon absorption in (111) oriented bulk GaAs. Our results match with the theory and previous all-optical experiments.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(190.0190) Nonlinear optics : Nonlinear optics
(190.5970) Nonlinear optics : Semiconductor nonlinear optics including MQW

Citation
J. K. Wahlstrand, R. P. Smith, J. A. Pipis, P. A. Roos, and S. T. Cundiff, "Electrical Measurement of Quantum Interference Population Control in a Semiconductor," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JWD105.
http://www.opticsinfobase.org/abstract.cfm?URI=LS-2006-JWD105


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