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Conference Paper
Laser Science
Rochester, New York United States
October 10, 2006
ISBN: 1-55752-818-7
Joint FiO/LS Poster Session II (JWD)

Comparison of Three Methods to Measure the Coherence Length of a Low Coherence Source

Maximino L. Arroyo Carrasco, Marcela M. Méndez Otero, René O. Hernández Sánchez, Alma Arroyo Vélez, and Erwin Martí Panameño

http://dx.doi.org/10.1364/FIO.2006.JWD39


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Abstract

We measure the coherence length of a Super Luminescent Diode with three different methods; its spectral profile, the visibility of an interference pattern and the photo-EMF effect. These permit us to compare the three techniques.

© 2006 Optical Society of America

OCIS Codes
(030.0030) Coherence and statistical optics : Coherence and statistical optics
(030.1640) Coherence and statistical optics : Coherence
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(070.2590) Fourier optics and signal processing : ABCD transforms

Citation
M. L. Arroyo Carrasco, M. M. Méndez Otero, R. O. Hernández Sánchez, A. Arroyo Vélez, and E. Martí Panameño, "Comparison of Three Methods to Measure the Coherence Length of a Low Coherence Source," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JWD39.
http://www.opticsinfobase.org/abstract.cfm?URI=LS-2006-JWD39


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