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Conference Paper
Laser Science
San Jose, California United States
September 16, 2007
ISBN: 1-55752-846-2
Welcome Reception and Joint FiO/LS Poster Session (JSuA)

Fabrication and Characterization of Er-Doped ZnO Films Grown by Pulsed E-Beam Deposition

Zhengda Pan, S. H. Morgan, A. Ueda, R. Aga, A. Steigerwald, Richard Mu, A B. Hmelo, and L Feldman

http://dx.doi.org/10.1364/FIO.2007.JSuA35


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Abstract

Erbium-doped ZnO thin films with nano-size grains were grown on silicon substrate by pulsed e-beam deposition. The luminescence provides evidence that the Er ions have been incorporated inside the crystalline ZnO grains in film.

© 2007 Optical Society of America

OCIS Codes
(160.0160) Materials : Materials
(160.5690) Materials : Rare-earth-doped materials
(310.0310) Thin films : Thin films
(310.1620) Thin films : Interference coatings

Citation
Z. Pan, S. H. Morgan, A. Ueda, R. Aga, A. Steigerwald, R. Mu, A. B. Hmelo, and L. Feldman, "Fabrication and Characterization of Er-Doped ZnO Films Grown by Pulsed E-Beam Deposition," in Frontiers in Optics 2007/Laser Science XXIII/Organic Materials and Devices for Displays and Energy Conversion, OSA Technical Digest (CD) (Optical Society of America, 2007), paper JSuA35.
http://www.opticsinfobase.org/abstract.cfm?URI=LS-2007-JSuA35

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