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Conference Paper
Laser Science
Rochester, New York United States
October 19-23, 2008
ISBN: 978-1-55752-861-2
Joint FiO/LS Poster Session II (JWA)

Evaluation of Scaled and Annular Pupils within the Framework of the Extended Nijboer-Zernike Formalism

Sven van Haver, Augustus J. Janssen, Joseph J. Braat, and Silvania F. Pereira


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We present concise formulae for the Zernike coefficients of numerical aperture reduced pupils and show how they can be exploited within the framework of the ENZ-formalism to characterize optical systems with scaled and annular pupils.

© 2008 The Optical Society

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(110.1220) Imaging systems : Apertures
(260.0260) Physical optics : Physical optics
(260.1960) Physical optics : Diffraction theory

S. van Haver, A. J. Janssen, J. J. Braat, and S. F. Pereira, "Evaluation of Scaled and Annular Pupils within the Framework of the Extended Nijboer-Zernike Formalism," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optical Society of America, 2008), paper JWA25.

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