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Spectroscopic Ellipsometry Study of a Swiss Cross Metamaterial

M.L. Miranda-Medina, B. Dastmalchi, H. Schmidt, E.-B. Kley, I. Bergmair, K. Hingerl, and J.J. Sanchez-Mondragon

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Abstract

We present spectroscopic ellipsometry measurements of a metamaterial, taken under different incidence angles and compared with calculations based on the RCWA method. We find that resonances for (Ψ, Δ) do not disappear changing the incidence angle.

© 2010 Optical Society of America

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