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Conference Paper
Laser Science
Rochester, New York United States
October 24-28, 2010
Joint FiO/LS Poster Session II (JWA)

Interferometric Measurement of Thickness and Refraction Index on Transparent Thin Films

Carlos A. Vargas and Edwin Tangarife  »View Author Affiliations


http://dx.doi.org/10.1364/FIO.2010.JWA62


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Abstract

A Mach-Zenhder interferometer is proposed with a thin film on one of its arms, the sample can be rotated, measuring the pattern fringes for each incidence angle, sample thickness and refraction index are calculated.

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties

Citation
C. A. Vargas and E. Tangarife, "Interferometric Measurement of Thickness and Refraction Index on Transparent Thin Films," in Frontiers in Optics 2010/Laser Science XXVI, OSA Technical Digest (CD) (Optical Society of America, 2010), paper JWA62.
http://www.opticsinfobase.org/abstract.cfm?URI=LS-2010-JWA62


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