Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Cavity-enhanced thin film measurements

Not Accessible

Your library or personal account may give you access

Abstract

We measure the thickness and complex index of refraction of a thin film by making ringdown measurements of a semi-transparent sample placed in an optical cavity.

© 2013 Optical Society of America

PDF Article
More Like This
Dual-Cavity Resonance for Broadband and Wide angle Absorption Enhancement in Thin Film Solar Cells

Guangyao Su, Fangwang Gou, Chuanhong Liu, and Zhaoyu Zhang
AF1K.3 Asia Communications and Photonics Conference (ACP) 2013

Absorptive Thin Film Characterization with Spectroscopic Full-field Optical Coherence Tomography

Tuan-Shu Ho, Chien-Chung Tsai, Kuang-Yu Hsu, and Sheng-Lung Huang
JW2A.49 CLEO: Applications and Technology (CLEO:A&T) 2013

Thickness and refractive index analysis of ellipsometry data of ultra-thin semi-transparent films

Poul-Erik Hansen and Jonas Skovlund Madsen
JM4A.24 3D Image Acquisition and Display: Technology, Perception and Applications (3D) 2018

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved