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Conference Paper
Laser Science
Orlando, Florida United States
October 6-10, 2013
ISBN: 978-1-55752-987-9
Advances in Nano-Opto-Mechanics II (LTh3G)

Complementarity of Intensity and Optical Force Measurements in Scanning Probe Microscopy

Dana C. Kohlgraf-Owens, Sergey Sukhov, and Aristide Dogariu  »View Author Affiliations


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We demonstrate that intensity and optical force gradient maps provide complementary measures of the near-field light distribution in scanning probe microscopy (SPM). Sensitivity of metal coated SPM probes to magnetic fields is shown.

© 2013 OSA

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(180.4243) Microscopy : Near-field microscopy
(120.4880) Instrumentation, measurement, and metrology : Optomechanics

D. C. Kohlgraf-Owens, S. Sukhov, and A. Dogariu, "Complementarity of Intensity and Optical Force Measurements in Scanning Probe Microscopy," in Frontiers in Optics 2013, P. Delyett, Jr. and D. Gauthier, eds., OSA Technical Digest (online) (Optical Society of America, 2013), paper LTh3G.5.

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