We demonstrate that intensity and optical force gradient maps provide complementary measures of the near-field light distribution in scanning probe microscopy (SPM). Sensitivity of metal coated SPM probes to magnetic fields is shown.
© 2013 OSA
D. C. Kohlgraf-Owens, S. Sukhov, and A. Dogariu, "Complementarity of Intensity and Optical Force Measurements in Scanning Probe Microscopy," in Frontiers in Optics 2013, P. Delyett, Jr. and D. Gauthier, eds., OSA Technical Digest (online) (Optical Society of America, 2013), paper LTh3G.5.
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