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Conference Paper
Plasmonics and Metamaterials
Rochester, New York United States
October 19-23, 2008
ISBN: 978-1-55752-861-2
Joint META/OF&T Poster Session (JWD)

Novel, Real-Time Measurement of Plasmon Resonance: Tailoring Nanoparticle Geometry Optically

Pae C. Wu, Maria Losurdo, Tong-Ho Kim, Giovanni Bruno, April S. Brown, and Henry O. Everitt

http://dx.doi.org/10.1364/OFT.2008.JWD36


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Abstract

We demonstrate novel use of in situ spectroscopic ellipsometry to probe in real-time metal nanoparticle deposition. Real-time monitoring of NP assembly plasmon resonance enables control of NP size via the plasmon resonance and vice versa.

© 2008 The Optical Society

OCIS Codes
(160.0160) Materials : Materials
(160.4760) Materials : Optical properties
(240.0240) Optics at surfaces : Optics at surfaces
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

Citation
P. C. Wu, M. Losurdo, T. Kim, G. Bruno, A. S. Brown, and H. O. Everitt, "Novel, Real-Time Measurement of Plasmon Resonance: Tailoring Nanoparticle Geometry Optically," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optical Society of America, 2008), paper JWD36.
http://www.opticsinfobase.org/abstract.cfm?URI=META_PLAS-2008-JWD36


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