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Nonlinear refractive index of As2S3 channel waveguides at 1.55 μm

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Abstract

The nonlinear refractive index (n2) of As2S3 channel waveguide has been measured at 1.55 μm. This measurement has been done in photodarkened and non photodarkened etched thin films.

© 2004 Optical Society of America

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