OSA's Digital Library

Optics InfoBase > Conference Papers > NLO > 2007 > MC > Page MC5 © 2007 OSA

Conference Paper
Nonlinear Optics: Materials, Fundamentals and Applications
Kona, Hawaii United States
July 30, 2007
ISBN: 1-55752-843-8
Nonlinear Optics in Novel Structures I (MC)

Nonlinear Refraction of Semiconductor Quantum Dots Using Single Wavelength and White-Light Continuum Z-scan

Lazaro A. Padilha, Gero Nootz, Mihaela Balu, David J. Hagan, and Eric W. Van Stryland

http://dx.doi.org/10.1364/NLO.2007.MC5


View Full Text Article

Acrobat PDF (77 KB) Note that full-text PDFs from conferences typically contain 1-3 pages of content, some or all of which might be an abstract, summary, or miscellaneous items.





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations
  • Export Citation/Save Click for help

Abstract

The nonlinear refractive index is measured in semiconductor quantum-dots using white light continuum Z-scan, which can measure nonlinear refraction as small as 10-16cm2/GW. The magnitude of the nonlinearity decreases for smaller quantum-dots.

© 2007 OSA

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.3270) Nonlinear optics : Kerr effect
(190.4720) Nonlinear optics : Optical nonlinearities of condensed matter

Citation
L. A. Padilha, G. Nootz, M. Balu, D. J. Hagan, and E. W. Van Stryland, "Nonlinear Refraction of Semiconductor Quantum Dots Using Single Wavelength and White-Light Continuum Z-scan," in Nonlinear Optics: Materials, Fundamentals and Applications, OSA Technical Digest (CD) (Optical Society of America, 2007), paper MC5.
http://www.opticsinfobase.org/abstract.cfm?URI=NLO-2007-MC5


Sort:  Journal  |  Reset

References

References are not available for this paper.

OSA is a member of CrossRef.

CrossCheck Deposited