The nonlinear refractive index is measured in semiconductor quantum-dots using white light continuum Z-scan, which can measure nonlinear refraction as small as 10-16cm2/GW. The magnitude of the nonlinearity decreases for smaller quantum-dots.
© 2007 OSA
L. A. Padilha, G. Nootz, M. Balu, D. J. Hagan, and E. W. Van Stryland, "Nonlinear Refraction of Semiconductor Quantum Dots Using Single Wavelength and White-Light Continuum Z-scan," in Nonlinear Optics: Materials, Fundamentals and Applications, OSA Technical Digest (CD) (Optical Society of America, 2007), paper MC5.
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