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Conferences > NLO > 2013 > NTu1B > NTu1B.4

Nonlinear refraction measurements of thin films by the dual-arm Z-scan method

Trenton R. Ensley, Honghua Hu, Alfred R. Ernst, Canek Fuentes-Hernandez, Amir Dindar, Bernard Kippelen, David J. Hagan, and Eric W. Van Stryland

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Abstract

We report nonlinear-refractive indices of ZnO films on relatively thick substrates using the dual-arm Z-scan method to remove the substrate signals and obtain values agreeing with bulk ZnO, thus verifying the sensitivity of the technique.

© 2013 Optical Society of America

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