OSA's Digital Library

Optics InfoBase > Conference Papers > NTM > 2009 > NMB > Page NMB3 © 2009 OSA

Conference Paper
Novel Techniques in Microscopy
Vancouver Canada
April 26-30, 2009
ISBN: 978-1-55752-871-1
Superresolution II (NMB)

Three-Dimensional Localization of Nano-Emitters with Nanometer-Level Precision

Iwan Märki, Stefan Geissbühler, Theo Lasser, and François Aguet

http://dx.doi.org/10.1364/NTM.2009.NMB3


View Full Text Article

Acrobat PDF (198 KB) Note that full-text PDFs from conferences typically contain 1-3 pages of content, some or all of which might be an abstract, summary, or miscellaneous items.





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations
  • Export Citation/Save Click for help

Abstract

We show nanometer-level localization accuracy of a single quantum-dot in three dimensions by self-interference and diffraction-pattern analysis. We believe that this approach has the capacity to push optical microscopy to the molecular level.

© 2009 The Optical Society

OCIS Codes
(100.0100) Image processing : Image processing
(100.6640) Image processing : Superresolution
(180.0180) Microscopy : Microscopy
(180.2520) Microscopy : Fluorescence microscopy

Citation
I. Märki, S. Geissbühler, T. Lasser, and F. Aguet, "Three-Dimensional Localization of Nano-Emitters with Nanometer-Level Precision," in Advances in Imaging, OSA Technical Digest (CD) (Optical Society of America, 2009), paper NMB3.
http://www.opticsinfobase.org/abstract.cfm?URI=NTM-2009-NMB3


Sort:  Journal  |  Reset

References

References are not available for this paper.

OSA is a member of CrossRef.

CrossCheck Deposited