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Conference Paper
Optical Amplifiers and Their Applications
Budapest Hungary
August 7, 2005
ISBN: 1-55752-790-3
Poster Session (ME)

Semiconductor Optical Amplifier Bar Prober

Martin H. Hu, Benjamin Hall, Catherine Caneau, Herve LeBlanc, Sean Coleman, Xingsheng Liu, Nick Visovsky, and Chung-En Zah


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This paper describes an SOA bar prober used as a high-throughput, manufacturing-oriented testing system. It is capable of automatically measuring optical gain, far-field, L-I and V-I characteristics of individual chips of multiple SOA bars.

© 2005 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(250.0250) Optoelectronics : Optoelectronics
(250.4480) Optoelectronics : Optical amplifiers

M. H. Hu, B. Hall, C. Caneau, H. LeBlanc, S. Coleman, X. Liu, N. Visovsky, and C. Zah, "Semiconductor Optical Amplifier Bar Prober," in Optical Amplifiers and Their Applications, Technical Digest (CD) (Optical Society of America, 2005), paper ME8.

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