No abstract available.
Y. Park, T. -. Ahn, Y. H. Kim, W. -. Han, U. -. Paek, and D. Y. Kim, "Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber," in Optical Fiber Communication Conference and International Conference on Quantum Information, 2001 OSA Technical Digest Series (Optical Society of America, 2001), paper TuM4.
References are not available for this paper.