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Conferences > OFS > 2006 > ThE > ThE43

Transverse Stress Measured by Four-Polarization-State Frequency Domain Interferometry at High-Spatial Resolution*

R. Joseph Espejo and Shellee D. Dyer

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Abstract

We demonstrate a new method for measuring transverse stress with 11.8 gm spatial resolution in a fiber Bragg grating sensor, without the use of polarization maintaining fiber, by combining a four-state polarization analysis with a layer-peeling algorithm. Measurements of the externally induced birefringence agree well with predicted values.

© 2006 IEICE

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