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Conference Paper
Optical Fabrication and Testing
Québec City Canada
June 18, 2000
ISBN: 1-55752-637-0
Manufacture/Test - Equipment & Facilities (OWA)

Quantitative roughness measurements with iTIRM

Robert-Jaap van der Bijl, H. van Brug, J.J.M. Braat, and O.W. Faehnle

http://dx.doi.org/10.1364/OFT.2000.OWA4


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No abstract available.

OCIS Codes
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness

Citation
R. van der Bijl, H. v. Brug, J. J. M. Braat, and O. W. Faehnle, "Quantitative roughness measurements with iTIRM," in Optical Fabrication and Testing, OSA Technical Digest (Optical Society of America, 2000), paper OWA4.
http://www.opticsinfobase.org/abstract.cfm?URI=OFT-2000-OWA4


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