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Conference Paper
Optical Fabrication and Testing
Tucson, Arizona United States
June 3, 2002
ISBN: 1-55752-719-9
Metrology Poster Preview (OWD)

testing at 1nm accuracy for sub-mm asphericity

Takashi Gemma, Shigeru Nakayama, Yuichi Takigawa, Hajime Ichikawa, Takahiro Yamamoto, Yusuke Fukuda, Tetsuji Onuki, and Toshiro Umeda

http://dx.doi.org/10.1364/OFT.2002.OWD4


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No abstract available.

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(220.1250) Optical design and fabrication : Aspherics

Citation
T. Gemma, S. Nakayama, Y. Takigawa, H. Ichikawa, T. Yamamoto, Y. Fukuda, T. Onuki, and T. Umeda, "testing at 1nm accuracy for sub-mm asphericity," in Optical Fabrication and Testing, A. Sawchuk, ed., Vol. 76 of OSA Trends in Optics and Photonics Series (Optical Society of America, 2002), paper OWD4.
http://www.opticsinfobase.org/abstract.cfm?URI=OFT-2002-OWD4


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