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Conference Paper
Optical Fabrication and Testing
Rochester, New York United States
October 10, 2006
ISBN: 1-55752-818-7
Materials and Material Properties (OFTuC)

Dual Interferometer System for Measuring Index of Refraction

Eric P.. Goodwin, John J.. Sullivan, Daniel G.. Smith, and John E.. Greivenkamp

http://dx.doi.org/10.1364/OFT.2006.OFTuC2


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Abstract

Geometrical limitations can sometimes preclude the accurate measurement of the bulk index of refraction. A novel dual interferometer system for measuring the bulk index of thin transparent optical materials is presented.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4530) Instrumentation, measurement, and metrology : Optical constants

Citation
E. P. Goodwin, J. J. Sullivan, D. G. Smith, and J. E. Greivenkamp, "Dual Interferometer System for Measuring Index of Refraction," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper OFTuC2.
http://www.opticsinfobase.org/abstract.cfm?URI=OFT-2006-OFTuC2


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