Geometrical limitations can sometimes preclude the accurate measurement of the bulk index of refraction. A novel dual interferometer system for measuring the bulk index of thin transparent optical materials is presented.
© 2006 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4530) Instrumentation, measurement, and metrology : Optical constants
E. P. Goodwin, J. J. Sullivan, D. G. Smith, and J. E. Greivenkamp, "Dual Interferometer System for Measuring Index of Refraction," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper OFTuC2.
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