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Conference Paper
Optical Fabrication and Testing
Rochester, New York United States
October 10, 2006
ISBN: 1-55752-818-7
Uncommon Ideas and Often Missed Details: In Memory of Frank Cooke (OFWA)

PSD Determination Using a Simultaneous-Phase Acquisition Interferometer for the Constellation-X Spectroscopy X-ray Telescope (SXT) Mirror Program

J. P. Lehan, T. T. Saha, and W. W. Zhang

http://dx.doi.org/10.1364/OFT.2006.OFWA2


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Abstract

We investigated the use of a simultaneous-phase acquisition interferometer for determining PSD. We found that the results obtained are strongly influenced by the methodology employed while collecting the data.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

Citation
J. P. Lehan, T. T. Saha, and W. W. Zhang, "PSD Determination Using a Simultaneous-Phase Acquisition Interferometer for the Constellation-X Spectroscopy X-ray Telescope (SXT) Mirror Program," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper OFWA2.
http://www.opticsinfobase.org/abstract.cfm?URI=OFT-2006-OFWA2


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