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Conference Paper
Optical Fabrication and Testing
Rochester, New York United States
October 10, 2006
ISBN: 1-55752-818-7
Uncommon Ideas and Often Missed Details: In Memory of Frank Cooke (OFWA)

Grating-Slit: An Unusual Optical Surface Test

Chao-Wen Liang and Jose Sasian

http://dx.doi.org/10.1364/OFT.2006.OFWA4


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Abstract

This method uses a DMD chip to generate a sinusoidal grating as the light source and uses a slit modulating light at the image location. The transverse ray aberration function is obtained through phase shifting.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(220.0220) Optical design and fabrication : Optical design and fabrication
(220.4840) Optical design and fabrication : Testing

Citation
C. Liang and J. Sasian, "Grating-Slit: An Unusual Optical Surface Test," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper OFWA4.
http://www.opticsinfobase.org/abstract.cfm?URI=OFT-2006-OFWA4


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