This method uses a DMD chip to generate a sinusoidal grating as the light source and uses a slit modulating light at the image location. The transverse ray aberration function is obtained through phase shifting.
© 2006 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(220.0220) Optical design and fabrication : Optical design and fabrication
(220.4840) Optical design and fabrication : Testing
C. Liang and J. Sasian, "Grating-Slit: An Unusual Optical Surface Test," in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper OFWA4.
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