Dual source microscope for the inspection of micro-optics

Robert E. Parks; Robert E. Parks

doi:10.1364/OFT.2008.OWC3

Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper OWC3
•https://doi.org/10.1364/OFT.2008.OWC3

Dual source microscope for the inspection of micro-optics

Robert E. Parks

Optical Fabrication and Testing 2008

Rochester, New York United States
21–24 October 2008
ISBN: 978-1-55752-861-2

From the session
Micro/Integrated Optics (OWC)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
R. E. Parks, "Dual source microscope for the inspection of micro-optics," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper OWC3.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

A dual light source microscope is described that can measure the first order optical properties of microlenses as well as centering and wavefront quality while simultaneously inspecting the surfaces for beauty defects.

PDF Article

More Like This

Novel Stent Optical Inspection System

Carlos Bermudez, Ferran Laguarta, Cristina Cadevall, Aitor Matilla, Sergi Ibañez, and Roger Artigas
AITh2B.3 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2016

Inspection of High-Volume Laser-Quality Optics

Gih-Horng Chen and Gary DeBell
FWA1 Optical Fabrication and Testing (OF&T) 1980

Interferometric Tests for Micro-Optics

N. Lindlein and J. Schwider
DWC.1 Diffractive Optics and Micro-Optics (DOMO) 1996

Previous Article Next Article