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Nondestructive Metrology of Layered Polymeric GRIN Materials Using Optical Coherence Tomography

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Abstract

Based on swept-source OCT technology, we investigated the unique capability of OCT for nondestructive three-dimensional characterization of the sub-surface textures and layer thickness profiles of layered polymeric GRIN samples in micrometer scale.

© 2012 Optical Society of America

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