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High accuracy measurements of thermal expansion in the temperature range 7 K to 323 K by interferometeric absolute length measurements

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Abstract

The coefficient of thermal expansion (CTE) of two ultra stable SiC ceramics was determined with uncertainties of less than 2 × 109 K1. The measurements were compared to commercial measurements and the comparison shows deviations smaller than 2×108 K1.

© 2014 Optical Society of America

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