Abstract
The metrology of freeform optics requires versatile instrumentation to address the variety of potential geometries. Traditional interferometry is often insufficient because large local slopes lead to unresolvable fringe patterns, much like steep aspheric optics. The departure from the best-fit sphere for freeform optics is potentially orders of magnitude more than for spherical and aspheric optics. Point-to-point probing with non-contact optical probes is one such solution that can be employed for a multitude of geometries. This work presents an overview of the positioning systems and probe architectures for non-contact measurements of freeform optics. We discuss the advantages and disadvantages of using this methodology for measuring freeform optics.
© 2014 Optical Society of America
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