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Determination of Optical Constants for an Arbitrarily Oriented Anisotropic Thin Film by Attenuated-Total-Reflection Method

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Abstract

Attenuated-total-reflection method is used here to determine the anisotropic properties of an arbitrarily oriented anisotropic thin film. By considering the asymmetric reflection phenomenon, the optical properties of the anisotropic film are obtained correctly.

© 2001 Optical Society of America

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