Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Exploring the Crystalline Microstructure of Thin Films Using a Series of Lanthanide Trifluorides as a Probe

Not Accessible

Your library or personal account may give you access

Abstract

The crystalline microstructure of thin films is explored in this paper using the Lanthanide Trifluoride materials as a probe. A series of lanthanide trifluoride single layers were deposited by thermal evaporation onto fused silica substrates at different temperatures. We have seen a correlation between quenching time and crystalline microstructure.

© 2001 Optical Society of America

PDF Article
More Like This
Optical, structural and mechanical properties of lanthanide trifluoride thin film materials for use in the DUV-spectral region

R. Thielsch, J. Heber, S. Jakobs, N. Kaiser, A. Duparré, and J. Ullmann
TuA.7 Optical Interference Coatings (OIC) 1998

Effect of Ion-Assisted Deposition on the Crystallinity of Samarium Fluoride Films

L. J. Lingg, C. K. Hwangbo, B. G. Bovard, J. P. Lehan, and H. A. Macleod
ThB10 Optical Interference Coatings (OIC) 1988

Physical microstructure of evaporated titania-silica and zirconia-silica multilayer thin films

P. Swab and R. E. Klinger
THV1 OSA Annual Meeting (FIO) 1985

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.