Index Determination for Metallic Thin Films

Michel Cathelinaud; Frédéric Lemarquis; Claude Amra

doi:10.1364/OIC.2001.TuF1

Optical Interference Coatings
OSA Technical Digest Series (Optica Publishing Group, 2001),
paper TuF1
•https://doi.org/10.1364/OIC.2001.TuF1

Index Determination for Metallic Thin Films

Michel Cathelinaud, Frédéric Lemarquis, and Claude Amra

Optical Interference Coatings 2001

Banff Canada
ISBN: 1-55752-682-6

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Materials and Properties of Optical Coatings (TuF)

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M. Cathelinaud, F. Lemarquis, and C. Amra, "Index Determination for Metallic Thin Films," in Optical Interference Coatings, OSA Technical Digest Series (Optica Publishing Group, 2001), paper TuF1.

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Abstract

We propose a method, based on reflectance and transmittance measurements, for the index determination of opaque and semi transparent metallic thin. Results are given concerning Nickel for the manufacturing of broad band absorbers.

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