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Conference Paper
Optical Interference Coatings
Tucson, Arizona United States
June 27, 2004
ISBN: 3-5400-0364-9
Monitoring (TuE)

Optical monitoring of dip coating

Alexandre F. Michels, Thiago Menegotto, Hans P. Grieneisen, and Flavio Horowitz

http://dx.doi.org/10.1364/OIC.2004.TuE2


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Abstract

Interferometric monitoring is applied to dip coating with Newtonian, non-volatile oils and compared to a simple model. For more complex films, a new polarimetric approach is introduced for direct measurement of a varying refractive index.

© 2004 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties

Citation
A. F. Michels, T. Menegotto, H. P. Grieneisen, and F. Horowitz, " Optical monitoring of dip coating," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper TuE2.
http://www.opticsinfobase.org/abstract.cfm?URI=OIC-2004-TuE2


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