Interferometric monitoring is applied to dip coating with Newtonian, non-volatile oils and compared to a simple model. For more complex films, a new polarimetric approach is introduced for direct measurement of a varying refractive index.
© 2004 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties
A. F. Michels, T. Menegotto, H. P. Grieneisen, and F. Horowitz, " Optical monitoring of dip coating," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper TuE2.
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