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Conference Paper
Optical Interference Coatings
Tucson, Arizona United States
June 27, 2004
ISBN: 3-5400-0364-9
Monitoring (TuE)

In-situ broadband monitoring and characterization of optical coatings

Steffen Wilbrandt, Robert Leitel, Dieter Gäbler, Olaf Stenzel, and Norbert Kaiser

http://dx.doi.org/10.1364/OIC.2004.TuE6


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Abstract

An in-situ broadband monitoring system to measure reflectance or transmittance of optical coatings deposited with IAD was developed. First results on the deposition of metal island layers and gradient refractive index layers are presented.

© 2004 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties

Citation
S. Wilbrandt, R. Leitel, D. Gäbler, O. Stenzel, and N. Kaiser, " In-situ broadband monitoring and characterization of optical coatings," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper TuE6.
http://www.opticsinfobase.org/abstract.cfm?URI=OIC-2004-TuE6


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