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Conference Paper
Optical Interference Coatings
Tucson, Arizona United States
June 27, 2004
ISBN: 3-5400-0364-9
Monitoring (TuE)

Turning-point monitoring is not simply optical thickness compensation

Stéphane Larouche, Aram Amassian, Bill Baloukas, and Ludvik Martinu

http://dx.doi.org/10.1364/OIC.2004.TuE8


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Abstract

Contrarily to widespread belief, turning-point monitoring entails more than simply optical thickness compensation. In fact, we demonstrate that optical thickness compensation is barely better than no correction at all for the fabrication of narrow-band filters.

© 2004 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties
(350.0350) Other areas of optics : Other areas of optics
(350.2460) Other areas of optics : Filters, interference

Citation
S. Larouche, A. Amassian, B. Baloukas, and L. Martinu, " Turning-point monitoring is not simply optical thickness compensation," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper TuE8.
http://www.opticsinfobase.org/abstract.cfm?URI=OIC-2004-TuE8


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