The electromagnetic near-field produced by the interaction between a transverse electric guided mode and a surface nano-defect in a planar structure is studied. A Fourier Transform technique is used to obtain the surface defect profile.
© 2004 Optical Society of America
J. Durán-Favela, J. Gaspar-Armenta, R. García-Llamas, and J. Valenzuela-Benavides, " Interaction between a guided mode and a surface nano defect," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WB8.
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