Photothermal deflection technique permits to highlight the presence of absorbing defects in optical components. The detection of nano-sized isolated inclusions requieres to develop a very sensitive photothermal setup.
© 2004 Optical Society of America
(110.0110) Imaging systems : Imaging systems
(110.0180) Imaging systems : Microscopy
(350.0350) Other areas of optics : Other areas of optics
(350.5340) Other areas of optics : Photothermal effects
B. Bertussi, M. Commandré, and J. Natoli, " High-resolution photothermal microscope: A very sensitive tool for the detection of nano-scale isolated absorbing defects in optical coatings," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WE6.
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