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Conference Paper
Optical Interference Coatings
Tucson, Arizona United States
June 3, 2007
ISBN: 1-55752-841-1
Measurements I (ThA)

High-Precision Measurements of the Specular Reflectivity

Hervé Piombini, Philippe Vaorino, Frédéric Sabary, Daniel Marteau, Jimmy Dubard, Jacques Hameury, and Jean-Rémy Filtz

http://dx.doi.org/10.1364/OIC.2007.ThA6


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Abstract

The spectrophotometer described is designed to measure specular reflectance with a high degree of accuracy. It can measure shape piece, antireflective or reflective coating and make cartographies in order to detect heterogeneities of coating.

© 2007 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.1840) Instrumentation, measurement, and metrology : Densitometers, reflectometers
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation

Citation
H. Piombini, P. Vaorino, F. Sabary, D. Marteau, J. Dubard, J. Hameury, and J. Filtz, " High-Precision Measurements of the Specular Reflectivity," in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper ThA6.
http://www.opticsinfobase.org/abstract.cfm?URI=OIC-2007-ThA6


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