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Conference Paper
Optical Interference Coatings
Tucson, Arizona United States
June 3, 2007
ISBN: 1-55752-841-1
Measurements I (ThA)

Explicit Refractive Index Determination from the Envelopes of the Ellipsometric Magnitude tan(psi)

Juan C. Anton

http://dx.doi.org/10.1364/OIC.2007.ThA9


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Abstract

We present some explicit formulas that link the properties of the interfaces delimiting an interference film to the envelopes of measured tan(ψ). Constants estimation is direct, free from regression analysis, thickness estimation or dispersion models.

© 2007 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties

Citation
J. C. Anton, " Explicit Refractive Index Determination from the Envelopes of the Ellipsometric Magnitude tan(psi)," in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper ThA9.
http://www.opticsinfobase.org/abstract.cfm?URI=OIC-2007-ThA9


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