We present some explicit formulas that link the properties of the interfaces delimiting an interference film to the envelopes of measured tan(ψ). Constants estimation is direct, free from regression analysis, thickness estimation or dispersion models.
© 2007 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties
J. C. Anton, " Explicit Refractive Index Determination from the Envelopes of the Ellipsometric Magnitude tan(psi)," in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper ThA9.
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