The Measurement Problem comprises measurements of the T and R spectra and the determination of the optical constants for a single oxide layer on fused silica. The angle of incidence is 45°.
© 2007 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties
A. Duparré and D. Ristau, " Measurement Problem," in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper ThB1.
References are not available for this paper.