Angular polarimetric phase measurements of the scattered field are studied for multilayers. We can then present a simple technique based on destructive interferences of the polarization states to selectively probe layers within optical multilayer coatings.
© 2007 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties
C. Amra, G. Georges, C. Deumié, and C. Grezes-Besset, " Efficiency of Polarimetric z-probing within Optical Multilayer," in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper ThB6.