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Optics InfoBase > Conference Papers > OIC > 2007 > WD > Page WD6 © 2007 OSA

Conference Paper
Optical Interference Coatings
Tucson, Arizona United States
June 3, 2007
ISBN: 1-55752-841-1
Thermal Properties (WD)

Characterization of Low Losses in Optical Thin Films and Materials

Christian Muehlig, Wolfgang Triebel, Siegfried Kufert, and Helmut Bernitzki

http://dx.doi.org/10.1364/OIC.2007.WD6


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Abstract

At various laser wavelengths, the laser induced deflection technique is applied to directly measure residual absorptions in thin films, materials and at surfaces. Accompanying, the laser induced fluorescence is applied to investigate possible absorbing species.

© 2007 Optical Society of America

OCIS Codes
(300.0300) Spectroscopy : Spectroscopy
(300.1030) Spectroscopy : Absorption
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties

Citation
C. Muehlig, W. Triebel, S. Kufert, and H. Bernitzki, " Characterization of Low Losses in Optical Thin Films and Materials," in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper WD6.
http://www.opticsinfobase.org/abstract.cfm?URI=OIC-2007-WD6

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