Characterization of low losses in Optical Thin Films and Materials

Ch. Mühlig; W. Triebel; S. Kufert; H. Bernitzki

doi:10.1364/OIC.2007.WD6

Optical Interference Coatings
OSA Technical Digest (CD) (Optica Publishing Group, 2007),
paper WD6
•https://doi.org/10.1364/OIC.2007.WD6

Characterization of low losses in Optical Thin Films and Materials

Ch. Mühlig, W. Triebel, S. Kufert, and H. Bernitzki

Optical Interference Coatings 2007

Tucson, Arizona United States
3–8 June 2007
ISBN: 1-55752-841-1

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C. Mühlig, W. Triebel, S. Kufert, and H. Bernitzki, "Characterization of low losses in Optical Thin Films and Materials," in Optical Interference Coatings, OSA Technical Digest (CD) (Optica Publishing Group, 2007), paper WD6.

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Abstract

At various laser wavelengths, the laser induced deflection technique is applied to directly measure residual absorptions in thin films, materials and at surfaces. Accompanying, the laser induced fluorescence is applied to investigate possible absorbing species.

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