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Conference Paper
Optical Interference Coatings
Tucson, Arizona United States
June 6-11, 2010
ISBN: 978-1-55752-891-9
Coatings for Solar Applications (MC)

Real Time Optical Monitoring of Properties of Silicon Thin Film Solar Panels

George Atanasoff

http://dx.doi.org/10.1364/OIC.2010.MC2


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Abstract

Optical monitoring of silicon absorbers is performed during deposition inside the chamber during solar panel manufacturing, providing adaptive control of the film quality in real time. Results are presented and benefits of monitoring are demonstrated.

© 2010 The Optical Society

OCIS Codes
(160.0160) Materials : Materials
(160.4760) Materials : Optical properties
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties

Citation
G. Atanasoff, "Real Time Optical Monitoring of Properties of Silicon Thin Film Solar Panels," in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2010), paper MC2.
http://www.opticsinfobase.org/abstract.cfm?URI=OIC-2010-MC2


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