Optical monitoring of silicon absorbers is performed during deposition inside the chamber during solar panel manufacturing, providing adaptive control of the film quality in real time. Results are presented and benefits of monitoring are demonstrated.
© 2010 The Optical Society
G. Atanasoff, "Real Time Optical Monitoring of Properties of Silicon Thin Film Solar Panels," in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2010), paper MC2.
References are not available for this paper.