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Conference Paper
Optical Interference Coatings
Tucson, Arizona United States
June 6-11, 2010
ISBN: 978-1-55752-891-9
Coatings for Solar Applications (MC)

Determining Quality of Microcrystal Silicon Thin Films Based on Infrared Absorption Coefficients

Sheng-Hui Chen, Hung-Ju Lin, Ting-Wei Chang, Hsuan-Wen Wang, Cheng-Chung Lee, Chun-Ming Yeh, and Yen-Yu Pan

http://dx.doi.org/10.1364/OIC.2010.MC4


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Abstract

We proposed the absorption coefficient ratio of (1.4 eV)/ (0.8 eV) as the quality factor of microcrystalline silicon thin films. It is convinced that a proportional relationship is between quality factor and solar cell efficiency.

© 2010 The Optical Society

OCIS Codes
(160.0160) Materials : Materials
(160.6000) Materials : Semiconductor materials
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties

Citation
S. Chen, H. Lin, T. Chang, H. Wang, C. Lee, C. Yeh, and Y. Pan, "Determining Quality of Microcrystal Silicon Thin Films Based on Infrared Absorption Coefficients," in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2010), paper MC4.
http://www.opticsinfobase.org/abstract.cfm?URI=OIC-2010-MC4


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