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Conference Paper
Optical Interference Coatings
Whistler Canada
June 16-21, 2013
ISBN: 978-1-55752-974-9
Applications I (MB)

Investigating the atomic structure and properties of Ta<sub>2</sub>O<sub>5</sub> coatings

Riccardo Bassiri, Matthew R. Abernathy, Konstantin B. Borisenko, Robert L. Byer, Keith Evans, Martin M. Fejer, Martin Hart, Angie C. Lin, Ian MacLaren, Ashot S. Markosyan, Iain W. Martin, Iain W. Martin, Roger K. Route, and Sheila Rowan  »View Author Affiliations


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The atomic structure and properties of Ta2O5 coatings are studied using a combination of X-ray absorption spectroscopy, transmission electron microcopy and atomic modeling, which is then correlated to macroscopic material properties.

© 2013 OSA

OCIS Codes
(160.4670) Materials : Optical materials
(160.4760) Materials : Optical properties
(310.3840) Thin films : Materials and process characterization

R. Bassiri, M. R. Abernathy, K. B. Borisenko, R. L. Byer, K. Evans, M. M. Fejer, M. Hart, A. C. Lin, I. MacLaren, A. S. Markosyan, I. W. Martin, I. W. Martin, R. K. Route, and S. Rowan, "Investigating the atomic structure and properties of Ta<sub>2</sub>O<sub>5</sub> coatings," in Optical Interference Coatings Postdeadline, M. Tilsch and D. Ristau, eds., OSA Technical Digest (online) (Optical Society of America, 2013), paper PMB.9.

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